Material layer thickness measurement
Automatic thickness measurement using parallel segments.
In addition to IPSDK Explorer, Reactiv’IP offers a tool to measure material layer thickness based on parallel lines. This method allows you to:
- determine with accuracy layer uniformity on a surface, which is a key factor for product quality and performance, especially in the coating and film industries.
- measure automatically the length across each parallel line regularly drawn perpendicularly to the main object direction, enabling thickness to be quantified in a highly accurate and repeatable way.
- be applied to a wide range of materials, such as metals, plastics and composites.
- offer enhanced precision, essential in demanding applications such as aerospace and electronics.
This tool can be adapted to any object orientation, providing mean, minimum and maximum thicknesses measured along the main axis.
The download package includes a macro that can be used for 2D images. The input image must be provided as a binary image. This script can be imported into IPSDK Explorer as a macro. The new command will then be directly available from the Global Measure section.